The Development Process of an SPI Chip on FPGA for Driving Embedded Devices
The Development Process of an SPI Chip on FPGA for Driving Embedded Devices
Price : 14000
The Development Process of an SPI Chip on FPGA for Driving Embedded Devices
Price : 14000
The Development Process of an SPI Chip on FPGA for Driving Embedded Devices
Abstract
Long Range Ultrasonic Testing (LRUT) is an emerging ultrasound Non-destructive Testing (NDT) method. The LRUT is a variant of the conventional NDT approach. By using ultrasound guided waves (UGWs) , it is efficient in quick long range defect scanning, which is impossible with other traditional NDT techniques. Increasing numbers of requirements for quick long range testing have led to urgent need for the improvement of testing methods and the development of new testing equipment to help researchers in laboratory and help technicians in field inspection.